Nanostructured thin films of indium oxide nanocrystals confined in alumina matrixes

Thin Solid Films

Volumn 519, Issue 7, 2011, Pages 2141-2145

  Bouifoulen, A ^a,b   Edely, M ^a   Errien, N ^a   Kassiba, A ^a   Outzourhit, A ^b   Makowska Janusik, M ^c   Gautier, N ^d   Lajaunie, L ^d   Oueriagli, A ^b  

^a UNIVERSITÉ DU MAINE   (France)

^b FACULTÉ DES SCIENCES SEMLALIA   (Morocco)

^c JAN DLUGOSZ UNIVERSITY   (Poland)

^d INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

Alumina; Composites; Crystal microstructures; Indium oxide; Optical properties; Sputtering; Thin films; Transmission electron microscopy; X ray diffraction

Indexed keywords

ALUMINA; ALUMINUM OXIDE; BOROSILICATE GLASS; COMPOSITE MATERIALS; CRYSTAL MICROSTRUCTURE; CRYSTALLINE MATERIALS; DEPOSITION; ENERGY GAP; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INDIUM COMPOUNDS; MICROSTRUCTURE; NANOCRYSTALS; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; OXIDE FILMS; SPUTTERING; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

DEPOSITION PARAMETERS; INDIUM OXIDE; INVESTIGATION METHODS; NANOSTRUCTURED FILMS; NANOSTRUCTURED THIN FILM; STRUCTURAL AND PHYSICAL PROPERTIES; SUBSTRATE TEMPERATURE; SYNTHESIS CONDITIONS;

OPTICAL FILMS;

EID: 78751642195     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.11.018     Document Type: Article

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