The modified Beckmann-Kirchhoff scattering theory for rough surface analysis

Pattern Recognition

Volumn 40, Issue 7, 2007, Pages 2004-2020

  Ragheb, Hossein ^a   Hancock, Edwin R ^b  

^a BU ALI SINA UNIVERSITY   (Iran)

^b UNIVERSITY OF YORK   (United Kingdom)

Author keywords

Beckmann model; BRDF measurements; Physics based reflectance models; Rough surface scattering; Roughness estimation

Indexed keywords

DATABASE SYSTEMS; DIGITAL CAMERAS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; REFLECTOMETERS; SCATTERING;

BECKMANN MODEL; BRDF MEASUREMENTS; PHYSICS-BASED REFLECTANCE MODELS; ROUGH SURFACE SCATTERING; ROUGHNESS ESTIMATION;

SURFACE ROUGHNESS;

EID: 33947696767     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2006.10.007     Document Type: Article

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