Snap-shot profilometry with the Empirical Mode Decomposition and a 3-layer color sensor

Optics Express

Volumn 19, Issue 2, 2011, Pages 1284-1290

  Equis, Sébastien ^a   Schnabel, Raik ^a   Jacquot, Pierre ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

FACE RECOGNITION; PIXELS; PROFILOMETRY; PROJECTION SYSTEMS; REMOTE SENSING; SENSOR ARRAYS;

3-LAYER ARCHITECTURES; COLOR SENSORS; COLOR TRANSFORMATION; DYNAMIC REGIMES; EMPIRICAL MODE DECOMPOSITION; END-USERS; FRINGE PATTERN; FRINGE PROJECTION SYSTEM; FRINGE PROJECTION TECHNIQUES; FULL-FIELD; INDUSTRIAL CONTROLS; KEY ELEMENTS; MEASUREMENT ACCURACY; NONUNIFORM; PHYSICAL SENSORS; PROJECTED FRINGE; PROJECTION MODELS; SIMULTANEOUS RECORDING; SPATIAL RESOLUTION; SPECTRAL RESPONSE; THREE PHASE; THREE-LAYER;

COLOR;

ARTICLE; COLORIMETRY; ENVIRONMENTAL MONITORING; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; INTERFEROMETRY; REFRACTOMETRY; SIGNAL PROCESSING;

COLORIMETRY; ENVIRONMENTAL MONITORING; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INTERFEROMETRY; REFRACTOMETRY; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 78751558966     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.001284     Document Type: Article

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