GGR Biennial Review: Key Advances in Secondary Ion Mass Spectrometry in the Geological Sciences during the Period 2008-2009

Geostandards and Geoanalytical Research

Volumn 34, Issue 4, 2010, Pages 387-394

  Wiedenbeck, Michael ^a  

^a GFZ GERMAN RESEARCH CENTRE FOR GEOSCIENCES   (Germany)

Author keywords

Environmental applications; Geochronology; Ion probe; NanoSIMS; Oxygen isotopes; Petrology; Time of flight SIMS

Indexed keywords

ENVIRONMENTAL APPLICATIONS; ION PROBE; NANOSIMS; OXYGEN ISOTOPES; TIME-OF-FLIGHT SIMS;

ABLATION; DEPTH PROFILING; GEOCHRONOLOGY; ISOTOPES; OXYGEN; PETROGRAPHY; PETROLOGY; PROBES; ROCKS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY; TRACE ELEMENTS;

IONS;

EID: 78651446613     PISSN: 16394488     EISSN: 1751908X     Source Type: Journal    
DOI: 10.1111/j.1751-908X.2010.00933.x     Document Type: Review

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