CAMECA IMS 7f-GEO: Specialized SIMS tool for geosciences

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 1472-1475

  Peres, Paula ^a   de Chambost, Emmanuel ^a   Schuhmacher, Michel ^a  

^a CAMECA   (United States)

Author keywords

CAMECA; IMS 7f GEO; Ion microprobe; Isotopic ratio; SIMS; Stable isotopes

Indexed keywords

ELECTRON MULTIPLIERS; ISOTOPES; SECONDARY ION MASS SPECTROMETRY; TRACE ELEMENTS;

CAMECA; IMS 7F-GEO; ION MICROPROBE; ISOTOPIC RATIOS; STABLE ISOTOPES;

ORBITS;

EID: 56449084670     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.053     Document Type: Article

References (5)

1. M. Schuhmacher, F. Fernandes, E. de Chambost, Proceedings of the Fourteenth International Conference SIMS XIV, 2003, pp. 878-882.
2. Desbois G., Ingrin J., Kita N.T., Valley J.W., and Deloule E. American Mineralogist 92 (2007) 453-459
3. Messenger S., Keller L.P., Stadermann F.J., Walker R.M., and Zinner E. Science 300 (2003) 105-108
4. G. Slodzian, J. C. Lorin, R. Dennebouy, A. Havette, Proceedings of the Fourth International Conference SIMS IV, 1983, pp. 153-157.
5. Slodzian G., Chaintreau M., Dennebouy R., and Rousse A. Eur. Phys. J. AP 14 (2001) 199-231