High precision SIMS oxygen isotope analysis and the effect of sample topography

Chemical Geology

Volumn 264, Issue 1-4, 2009, Pages 43-57

  Kita, Noriko T ^a   Ushikubo, Takayuki ^a   Fu, Bin ^a   Valley, John W ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

High precision; Instrumental bias; Isotope ratios; Oxygen; Secondary ion mass spectrometer

Indexed keywords

ISOTOPIC ANALYSIS; ISOTOPIC RATIO; MASS SPECTROMETRY; OXYGEN; STABLE ISOTOPE; TOPOGRAPHY;

NORTH AMERICA; UNITED STATES; WISCONSIN;

EID: 67349122303     PISSN: 00092541     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chemgeo.2009.02.012     Document Type: Article

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