Free volume distribution at the Teflon AF®/silicon interfaces probed by a slow positron beam

Polymer

Volumn 52, Issue 2, 2011, Pages 505-509

  Harms, Stephan ^a   Rätzke, Klaus ^a   Zaporojtchenko, Vladimir ^a   Faupel, Franz ^a   Egger, Werner ^b   Ravelli, Luca ^b  

^a UNIVERSITY OF KIEL   (Germany)

^b BUNDESWEHR UNIVERSITY MUNICH   (Germany)

Author keywords

Free volume; Interphase; Positron annihilation

Indexed keywords

ELECTRONS; FREE VOLUME; POSITRON ANNIHILATION; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS;

FREE VOLUME DISTRIBUTION; HIGH MOLECULAR WEIGHT; HOLE SIZE DISTRIBUTION; INTERFACIAL REGION; INTERPHASE; POSITRON ANNIHILATION LIFETIME SPECTROSCOPY; POSITRON IMPLANTATION; SLOW POSITRON BEAM;

POLYTETRAFLUOROETHYLENES;

EID: 78651389102     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2010.11.039     Document Type: Article

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