Free volume behavior in spincast thin film of polystyrene by energy variable positron annihilation lifetime spectroscopy

Polymer

Volumn 50, Issue 14, 2009, Pages 3343-3346

  Ata, S ^a   Muramatsu, M ^a,b   Takeda, J ^a   Ohdaira, T ^a   Suzuki, R ^b   Ito, K ^b   Kobayashi, Y ^b   Ougizawa, T ^a  

^a Tokyo Institute of Technology ^*  (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Free volume; Polystyrene thin film; Positron annihilation lifetime spectroscopy

Indexed keywords

CHAINS; ELECTRONS; FREE VOLUME; GLASS TRANSITION; POLYSTYRENES; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; THERMAL EXPANSION;

DILUTED SOLUTIONS; ENERGY VARIABLES; OVERLAP CONCENTRATION; POLYSTYRENE THIN FILMS; POSITRON ANNIHILATION LIFETIME SPECTROSCOPY; PRECURSOR SOLUTIONS; SILICON SUBSTRATES; TOLUENE SOLUTION;

THIN FILMS;

CONCENTRATION; FILM; POLYSTYRENE; PRECURSOR; SOLVENT; THERMAL EXPANSION; THICKNESS;

EID: 67649132662     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2009.04.060     Document Type: Article

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