Polarization characteristics of low-loss nano-core buried optical waveguides and directional couplers

IEEE International Conference on Group IV Photonics GFP

Volumn , Issue , 2010, Pages 260-262

  Dai, Daoxin ^a   Wang, Zhi ^a   Bauters, Jared F ^a   Tien, M Ch ^a   Heck, Martijn J R ^a   Blumenthal, Daniel J ^a   Bowers, John E ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOW LOSS; LOW-LOSS OPTICAL WAVEGUIDES; POLARIZATION CHARACTERISTICS;

DIRECTIONAL COUPLERS; OPTICAL WAVEGUIDES; SILICON NITRIDE; WAVEGUIDES;

PHOTONICS;

EID: 78651365968     PISSN: 19492081     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/GROUP4.2010.5643361     Document Type: Conference Paper

References (5)

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2. R. Adar et al., less-than-1 db per meter propagation loss of silica wave-guides measured using a ring-resonator J. Lightwave Technol. 12 (1994): 1369.
3. W. Bogaerts, et al. Silicon-on-Insulator Spectral Filters Fabricated With CMOS Technology, IEEE J. Sel. Top. Quant. Electron. 16(2010): 33
4. Bo Yang, et al., Fabrication and characterization of small optical ridge waveguides based on SU-8 polymer. IEEE Journal of Lightwave Technology. 27(2009): 4091.
5. Jared F. Bauters, Martijn J. R. Heck, Demis John, Ming-Chun Tien, Arne Leinse, René G. Heideman, Daniel J. Blumenthal and John E. Bowers. Ultra-low Loss Silica-based Waveguides with Millimeter Bend Radius, ECOC 2010 (submitted).