A Bayesian optimal design for accelerated degradation tests

Quality and Reliability Engineering International

Volumn 26, Issue 8, 2010, Pages 863-875

  Liu, Xiao ^a   Tang, Loon Ching ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Accelerated degradation test; Bayesian optimal design; Gibbs sampler; Hot carrier induced degradation; Monte Carlo simulation; Physically based statistical model

Indexed keywords

ACCELERATED DEGRADATION TESTS; BAYESIAN OPTIMAL DESIGNS; GIBBS SAMPLERS; HOT-CARRIER-INDUCED DEGRADATION; MONTE CARLO SIMULATION; PHYSICALLY BASED;

BAYESIAN NETWORKS; COSMIC RAY DETECTORS; DEGRADATION; DESIGN; FIELD EFFECT TRANSISTORS; MAXIMUM LIKELIHOOD; MONTE CARLO METHODS; OPTIMAL SYSTEMS; OPTIMIZATION; STATISTICAL TESTS;

COMPUTER SIMULATION;

EID: 78651261837     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.1151     Document Type: Article

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