Measuring complex permeability of ferromagnetic thin film up to 10 GHz

Progress In Electromagnetics Research Letters

Volumn 9, Issue , 2009, Pages 139-145

  Wu, Y ^a   Tang, Z ^a   Xu, Y ^a   Zhang, B ^a   He, X ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX NETWORKS; CONFORMAL MAPPING; ELECTRIC NETWORK ANALYZERS; FERROMAGNETIC MATERIALS; FERROMAGNETISM; SCATTERING PARAMETERS;

COMPLEX PERMEABILITY; ELECTROMAGNETIC RESONANCE; FERROMAGNETIC THIN FILMS; MICROSTRIPES; VECTOR NETWORK ANALYZERS;

THIN FILMS;

EID: 78651250225     PISSN: 19376480     EISSN: None     Source Type: Journal    
DOI: 10.2528/PIERL09061201     Document Type: Article

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