An improved measurement configuration for determining the permeability of ferromagnetic thin film materials

Journal of Electromagnetic Waves and Applications

Volumn 22, Issue 2-3, 2008, Pages 343-352

  Wu, Y ^a   Tang, Z ^a   Xu, Y ^a   Zhang, B ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; FERROMAGNETIC MATERIALS; MAGNETIC PERMEABILITY; SUPPORT VECTOR MACHINES;

FERROMAGNETIC THIN FILM MATERIALS; MICROSTRIP CONFIGURATION;

THIN FILMS;

EID: 42549121504     PISSN: 09205071     EISSN: 15693937     Source Type: Journal    
DOI: 10.1163/156939308784160811     Document Type: Article

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