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Chemical Physics Letters

Volumn 502, Issue 1-3, 2011, Pages 118-120

Hole mobility measurement of 4,4′-Bis[N-(1-naphthyl)-N-phenylamino]- biphenyl by dark injection method

(6) Chiba, Takayuki a Nakayama, Ken Ichi a,b Pu, Yong Jin a Nishina, Tatsuo a Yokoyama, Masaaki a,c Kido, Junji a

a YAMAGATA UNIVERSITY (Japan)

b JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

c OSAKA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER HEIGHTS; DARK INJECTION; HOLE INJECTION BARRIERS; HOLE-TRANSPORTING MATERIALS; INDIUM TIN OXIDE; MOBILITY MEASUREMENTS; RESPONSE TIME; TIME-OF-FLIGHT METHOD; VACUUM DEPOSITED FILMS;

BRIDGE CIRCUITS; TIN; TIN OXIDES;

HOLE MOBILITY;

EID: 78651231863 PISSN: 00092614 EISSN: None Source Type: Journal
DOI: 10.1016/j.cplett.2010.11.083 Document Type: Article

Times cited : (15)

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