Measure the complex permeability of ferromagnetic thin films: Comparison shorted microstrip method with microstrip transmission method

Progress In Electromagnetics Research Letters

Volumn 11, Issue , 2009, Pages 173-181

  Wu, Y ^a   Tang, Z ^a   Xu, Y ^a   Zhang, B ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX NETWORKS; CONFORMAL MAPPING; ELECTRIC NETWORK ANALYZERS; FERROMAGNETIC MATERIALS; FERROMAGNETISM; FIXTURES (TOOLING); MECHANICAL PERMEABILITY; PARAMETER ESTIMATION; SCATTERING PARAMETERS; THIN FILM CIRCUITS;

BROADBAND MEASUREMENTS; COMPLEX PERMEABILITY; EFFECTIVE PERMEABILITY; FERROMAGNETIC THIN FILMS; MEASUREMENT SENSITIVITY; MICROSTRIP TRANSMISSION; MICROSTRIPES; VECTOR NETWORK ANALYZERS;

THIN FILMS;

EID: 78651228906     PISSN: 19376480     EISSN: None     Source Type: Journal    
DOI: 10.2528/PIERL09082004     Document Type: Article

References (9)

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