The absolute calibration of a small-angle scattering instrument with a laboratory X-ray source

Journal of Physics: Conference Series

Volumn 247, Issue , 2010, Pages

  Fan, Lixin ^a   Degen, Mike ^a   Bendle, Scott ^a   Grupido, Nick ^a   Ilavsky, Jan ^b  

^a Rigaku Innovative Technologies Inc   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GLASS; GLASSY CARBON; STANDARDS; X RAY SCATTERING;

ADVANCED PHOTON SOURCE; ARGONNE NATIONAL LABORATORY; CALIBRATION CAPABILITIES; DIFFERENTIAL CROSS SECTION; ISOTHERMAL COMPRESSIBILITY; MULTI-PHASED SYSTEMS; SCATTERING LENGTH DENSITY; SMALL ANGLE SCATTERING;

CALIBRATION;

EID: 78651076422     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/247/1/012005     Document Type: Conference Paper

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