Studies on conventional and SankaranarayananRamasamy (SR) method grown ferroelectric glycine phosphite (GPI) single crystals

Journal of Crystal Growth

Volumn 314, Issue 1, 2011, Pages 207-212

  Senthil Pandian, M ^a   Pattanaboonmee, N ^b   Ramasamy, P ^a   Manyum, P ^b  

^a SSN COLLEGE OF ENGINEERING   (India)

^b SURANAREE UNIVERSITY OF TECHNOLOGY   (Thailand)

Author keywords

A1. Crystal morphology; A1. Defects; A1. Directional solidification; A1. X ray diffraction; A2. Growth from solutions

Indexed keywords

A1. DEFECTS; CHEMICAL ETCHING; CONVENTIONAL METHODS; CRYSTAL MORPHOLOGIES; DIELECTRIC ANALYSIS; DIRECTIONAL SOLIDIFICATION; GLYCINE PHOSPHITES; GROWN CRYSTALS; GROWTH FROM SOLUTION; LASER DAMAGE THRESHOLD; LOSS MEASUREMENT; LOW DENSITY; SLOW EVAPORATION; SOLUTION TECHNIQUES; VICKERS MICROHARDNESS;

AMINO ACIDS; CHEMICAL ANALYSIS; DEFECTS; DIELECTRIC DEVICES; DIELECTRIC LOSSES; DIFFRACTION; ETCHING; EVAPORATION; FERROELECTRIC MATERIALS; LASER DAMAGE; MORPHOLOGY; SOLIDIFICATION; X RAY DIFFRACTION;

SINGLE CRYSTALS;

EID: 78651067050     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2010.11.093     Document Type: Article

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