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Volumn , Issue , 2010, Pages 149-152
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Parameters variability effects on microstrip interconnects via hermite polynomial chaos
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Author keywords
Circuit modeling; Circuit simulation; Stochastic analysis; Tolerance analysis; Transmission lines; Uncertainty
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Indexed keywords
CIRCUIT SIMULATION;
ELECTRIC LINES;
ELECTRONICS PACKAGING;
FITS AND TOLERANCES;
MONTE CARLO METHODS;
POLYNOMIALS;
STOCHASTIC SYSTEMS;
UNCERTAINTY ANALYSIS;
CIRCUIT MODELING;
ENHANCED TRANSMISSION LINE MODEL;
HERMITE POLYNOMIAL CHAOS;
HIGH SPEED INTERCONNECT;
MICROSTRIP INTERCONNECTS;
STOCHASTIC ANALYSIS;
TOLERANCE ANALYSIS;
UNCERTAINTY;
FREQUENCY DOMAIN ANALYSIS;
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EID: 78650948674
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/EPEPS.2010.5642568 Document Type: Conference Paper |
Times cited : (11)
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References (8)
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