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Volumn 62, Issue 12, 2010, Pages 29-34

Measuring depth-dependent dislocation densities and Elastic strains in an indented Ni-based Superalloy

(5) Barabash, O M a Santella, M b Barabash, R I a Ice, G E b Tischler, J b

a UNIVERSITY OF TENNESSEE (United States)

b OAK RIDGE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATION DENSITIES; ELASTIC STRAIN; ELASTIC-PLASTIC; ELASTIC-PLASTIC TRANSITION; ELECTRON BACKSCATTERING DIFFRACTION; GEOMETRICALLY NECESSARY DISLOCATIONS; MEASURING DEPTH; NI-BASED SUPERALLOYS; RESIDUAL COMPRESSION; X RAY MICRODIFFRACTION;

DIFFRACTION; ELASTOPLASTICITY; SUPERALLOYS; X RAY DIFFRACTION;

THREE DIMENSIONAL;

EID: 78650900671 PISSN: 10474838 EISSN: 15431851 Source Type: Journal
DOI: 10.1007/s11837-010-0177-5 Document Type: Article

Times cited : (14)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.