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1
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69249115386
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Concentration photovoltaics for highest effciencies and cost reduction
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Barcelona, Spain
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Luther J, Luque A, Bett AW, Dimroth F, Lerchenmüller H, Sala G, Algora C,. Concentration photovoltaics for highest effciencies and cost reduction. 20th European Photovoltaic Solar Energy Conference, Barcelona, Spain, 2005.
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20th European Photovoltaic Solar Energy Conference
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Luther, J.1
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Dimroth, F.4
Lerchenmüller, H.5
Sala, G.6
Algora, C.7
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2
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78649262388
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A dual junction solar cell with an efficiency of 32.6% at 1000 suns and 31.0% at 3000 suns
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Palm Desert, November
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Algora C, Rey-Stolle I, García I, Galiana B, Baudrit M, Espinet P, Barrigõn E, Datas A, González JR, Bautista J,. A dual junction solar cell with an efficiency of 32.6% at 1000 suns and 31.0% at 3000 suns. 5th International Conference for the Generation of Electricity, Palm Desert, November 2008.
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5th International Conference for the Generation of Electricity
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Algora, C.1
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Galiana, B.4
Baudrit, M.5
Espinet, P.6
Barrigõn, E.7
Datas, A.8
González, J.R.9
Bautista, J.10
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3
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77955165622
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Band-gap-engineered architectures for high-efficiency multijunction concentrator solar cells
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Hamburg, September
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King RR, Boca A, Hong W, Liu X-Q, Bhusari D, Larrabee D, Edmondson KM, Law DC, Fetzer CM, Mesropian S, Karam NH,. Band-gap-engineered architectures for high-efficiency multijunction concentrator solar cells. 24th European Phtovoltaic Solar Energy Conference and Exhibition, Hamburg, September 2009.
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24th European Phtovoltaic Solar Energy Conference and Exhibition
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King, R.R.1
Boca, A.2
Hong, W.3
Liu, X.-Q.4
Bhusari, D.5
Larrabee, D.6
Edmondson, K.M.7
Law, D.C.8
Fetzer, C.M.9
Mesropian, S.10
Karam, N.H.11
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5
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49149100972
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Long term reliability of PV module
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Barcelona, Spain
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Wohlgemuth JH, Cunningham DW, Nguyen AM, Miller J,. Long term reliability of PV module. 20th European Photovoltaic Solar Energy Conference, Barcelona, Spain, 2005; 1942-1946.
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20th European Photovoltaic Solar Energy Conference
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Wohlgemuth, J.H.1
Cunningham, D.W.2
Nguyen, A.M.3
Miller, J.4
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8
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III-V Concentrator solar cell reliability prediction based on quantitative LED reliability data
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Vázquez M, Algora C, Rey-Stolle I, González JR,. III-V Concentrator solar cell reliability prediction based on quantitative LED reliability data. Progress in Photovoltaics: Research and Applications 2007; 15 (6). 477-491.
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Progress in Photovoltaics: Research and Applications
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Vázquez, M.1
Algora, C.2
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9
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67649442534
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Reliability analysis of temperature step-stress tests on III-V high concentrator solar cells
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10.1016/j.microrel.2009.04.001.
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González JR, Vázquez M, Núñez N, Algora C, Rey-Stolle I, Galiana B,. Reliability analysis of temperature step-stress tests on III-V high concentrator solar cells. Microelectronics Reliability 2009; 49: 673-680. 10.1016/j.microrel.2009.04.001.
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Microelectronics Reliability
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10
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A method for correlating field life degradation with relaibility prediction for electronic modules
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Coit DW, Evans JL, Vogt NT, Thomson JR,. A method for correlating field life degradation with relaibility prediction for electronic modules. Quality and Reliability Engineering International 2005; 21: 715-726.
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Coit, D.W.1
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Reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation
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Huang W, Askin RG,. Reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation. Quality and Reliability Engineering International 19: 241-254.
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Quality and Reliability Engineering International
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Huang, W.1
Askin, R.G.2
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15
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84871787032
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A mirror-less design for micro-concentrator modules
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Terao A, Mulligan WP, Daroczi SG, Pujol OC, Verlinden PJ, Swanson RM, Miñano JC, Benítez P, Úlvarez JL,. A mirror-less design for micro-concentrator modules. In IEEE 28th Photovoltaic Specialist Conference, 2000; 1416-1419.
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IEEE 28th Photovoltaic Specialist Conference
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Terao, A.1
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Miñano, J.C.7
Benítez, P.8
Úlvarez, J.L.9
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16
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78650687815
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Systems and Instruments Integration Group of IES-UPM. Private Communication.
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Systems and Instruments Integration Group of IES-UPM. Private Communication.
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17
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78650707420
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IEC 600-50-191 International Electrotechnical Vocabulary. Chapter 191: Dependability and quality of service.
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IEC 600-50-191 International Electrotechnical Vocabulary. Chapter 191: Dependability and quality of service.
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18
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34548691260
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High temperature electro-optical degradation of InGaN/GaN HBLEDs
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Meneghini M, Trevisanello L, Sanna C, Mura G, Vanzi M, Meneghesso G, Zanoni E,. High temperature electro-optical degradation of InGaN/GaN HBLEDs. Microelectronics Reliability 2007; 47: 1625-1629.
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Microelectronics Reliability
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Meneghini, M.1
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Zanoni, E.7
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