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Volumn 19, Issue 1, 2011, Pages 113-122

Real-time reliability test for a CPV module based on a power degradation model

Author keywords

concentrator systems; reliability

Indexed keywords

CONCENTRATOR PHOTOVOLTAICS; CONCENTRATOR SYSTEMS; GAAS; MODULE-BASED; PERFORMANCE PARAMETERS; POWER DEGRADATION; RELIABILITY FUNCTIONS; RELIABILITY TEST; SINGLE JUNCTION SOLAR CELLS; TIME CONDITION; TOTAL INTERNAL REFLECTIONS;

EID: 78650689236     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.991     Document Type: Article
Times cited : (16)

References (18)
  • 9
    • 67649442534 scopus 로고    scopus 로고
    • Reliability analysis of temperature step-stress tests on III-V high concentrator solar cells
    • 10.1016/j.microrel.2009.04.001.
    • González JR, Vázquez M, Núñez N, Algora C, Rey-Stolle I, Galiana B,. Reliability analysis of temperature step-stress tests on III-V high concentrator solar cells. Microelectronics Reliability 2009; 49: 673-680. 10.1016/j.microrel.2009.04.001.
    • (2009) Microelectronics Reliability , vol.49 , pp. 673-680
    • González, J.R.1    Vázquez, M.2    Núñez, N.3    Algora, C.4    Rey-Stolle, I.5    Galiana, B.6
  • 11
    • 0037930607 scopus 로고    scopus 로고
    • Reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation
    • Huang W, Askin RG,. Reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation. Quality and Reliability Engineering International 19: 241-254.
    • Quality and Reliability Engineering International , vol.19 , pp. 241-254
    • Huang, W.1    Askin, R.G.2
  • 16
    • 78650687815 scopus 로고    scopus 로고
    • Systems and Instruments Integration Group of IES-UPM. Private Communication.
    • Systems and Instruments Integration Group of IES-UPM. Private Communication.
  • 17
    • 78650707420 scopus 로고    scopus 로고
    • IEC 600-50-191 International Electrotechnical Vocabulary. Chapter 191: Dependability and quality of service.
    • IEC 600-50-191 International Electrotechnical Vocabulary. Chapter 191: Dependability and quality of service.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.