Smaller are noisier: Signal-to-noise ratio and bit-error degradation in bulk-, quantum well- and quantum wire-nanoscale FETs

AIP Conference Proceedings

Volumn 922, Issue , 2007, Pages 208-211

  Oriols, X ^a   Jimenez D ^a   Albareda, G ^a   Lopez H ^a  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

analog and digital FET applications; Nanoscale FET; shot noise; thermal noise

Indexed keywords

EID: 78650565988     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2759668     Document Type: Conference Paper

References (7)

1. Ya. M. Blanter and M. Büttiker, Phys. Rep. 336, 1 (2000).
2. c-max [3].
3. X.Oriols et al, Solid State Electronics, 51, 306 (2007).
4. T. Gonzalez et al., Semicond. Sci.Technol. 14, L37 (1999).
5. X.Oriols, Physical Review Letters. 98, 066803 (2007).
6. D. Jiménez et al., J. Appl. Phys. 94, 1061 (2003).
7. L.B.Kish, Physics Letters A. 305, 144 (2002).