Effect of small addition of Mn on the passivation of Zn in 0.1 M NaOH solution

Electrochimica Acta

Volumn 56, Issue 3, 2011, Pages 1417-1425

  Shang, Xiu Ling ^a   Zhang, Bo ^a   Han, En Hou ^a   Ke, Wei ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

Author keywords

AFM; Mn additions; Passivation; XPS; Zn

Indexed keywords

AFM; AFM OBSERVATION; ELECTROCHEMICAL IMPEDANCE MEASUREMENTS; ELECTROCHEMICAL MEASUREMENTS; FILM POROSITY; GRAIN SIZE; MN ADDITION; MN CONTENT; MOTT-SCHOTTKY ANALYSIS; NAOH SOLUTIONS; OUTER LAYER; PASSIVE CURRENT DENSITIES; PASSIVE FILMS; XPS; ZN;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; FILM GROWTH; PASSIVATION; SURFACE ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC;

MANGANESE;

EID: 78650517680     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2010.10.067     Document Type: Article

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