Determination of trace elements in coffee beans by XRF spectrometer equipped with polarization optics and its application to identification of their production area

Bunseki Kagaku

Volumn 59, Issue 10, 2010, Pages 863-871

  Akamine, Takao ^a   Otaka, Akiko ^a   Hokura, Akiko ^b   Ito, Yuji ^c   Nakai, Izumi ^a  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b TOKYO DENKI UNIVERSITY   (Japan)

^c Kirin Company   (Japan)

Author keywords

Coffee beans; Geographic origin; Multivariate analysis; Trace elements; X ray fluorescence analysis

Indexed keywords

EID: 78650432415     PISSN: 05251931     EISSN: None     Source Type: Journal    
DOI: 10.2116/bunsekikagaku.59.863     Document Type: Article

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