Structural characterization of nanocrystalline Sb-doped SnO2 xerogels by multiedge x-ray absorption spectroscopy

Journal of Physical Chemistry C

Volumn 114, Issue 45, 2010, Pages 19206-19213

  Geraldo, V ^a,b   Briois, V ^c   Scalvi, L V A ^a   Santilli, C V ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

^c SYNCHROTRON SOLEIL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY DOPING; CRYSTALLITE GROWTH; DEPOSITED FILMS; DOPED SAMPLE; DOPING LEVELS; ELECTRICAL CONDUCTIVITY; EXAFS; EXAFS DATA; HOST MATRICES; LINEAR COMBINATIONS; NANOCRYSTALLINES; OXIDATION STATE; SB K-EDGE; SB-DOPED SNO; STRUCTURAL CHARACTERIZATION; STRUCTURE AND PROPERTIES;

ABSORPTION SPECTROSCOPY; ANTIMONY; ATOMIC SPECTROSCOPY; ATOMS; CRYSTALLITES; ELECTRIC CONDUCTIVITY; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MOBILITY; GRAIN BOUNDARIES; OXIDATION; TIN; TIN OXIDES; XEROGELS;

DOPING (ADDITIVES);

EID: 78650393943     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp106001x     Document Type: Article

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