SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium Proceedings

Volumn 1210, Issue , 2010, Pages 159-164

Optical and physical characterization of Cu2-xSe thin films for real time spectroscopic ellipsometry on Cu(In,Ga)Se2-based photovoltaic devices

(6) Walker, James D a Khatri, Himal a Little, Scott a Ranjan, Vikash a Collins, Robert a Marsillac, Sylvain a

a UNIVERSITY OF TOLEDO (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY COMPOUNDS; COPPER INDIUM GALLIUM DISELENIDE; CU(IN , GA)SE; DIELECTRIC FUNCTIONS; EX SITU; FLUXING AGENTS; GROWTH PROCESS; HIGH EFFICIENCY; IN-SITU; INDUSTRIAL SCALE; MATERIAL FABRICATION; OPTICAL MODELS; PHOTOVOLTAIC DEVICES; PHYSICAL CHARACTERIZATION; REAL TIME; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; REFLECTANCE MEASUREMENTS; ROOM TEMPERATURE; SEM MICROGRAPHS;

COPPER; FABRICATION; GALLIUM; GRAIN BOUNDARIES; GRAIN GROWTH; GROWTH TEMPERATURE; OPTICAL PROPERTIES; OPTICAL SYSTEMS; PHOTOVOLTAIC EFFECTS; SEMICONDUCTING SELENIUM COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE ROUGHNESS;

FEEDBACK;

EID: 78650380251 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (3)

References (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.