-
2
-
-
0032023157
-
Reliability comparison of tantalum and niobium solid electrolytic capacitors
-
Pozdeev Y. Reliability comparison of tantalum and niobium solid electrolytic capacitors. Quality and Reliability Engineering International 1998, 14(2):79-82.
-
(1998)
Quality and Reliability Engineering International
, vol.14
, Issue.2
, pp. 79-82
-
-
Pozdeev, Y.1
-
3
-
-
64449088405
-
Anodically formed oxide films on niobium: microstructural and electrical properties
-
June (9)
-
Störmer H., Weber A., Fischer V., Ivers-Tiffée E., Gerthsen D. Anodically formed oxide films on niobium: microstructural and electrical properties. Journal of the European Ceramic Society 2009, 29(June (9)):1743-1753.
-
(2009)
Journal of the European Ceramic Society
, vol.29
, pp. 1743-1753
-
-
Störmer, H.1
Weber, A.2
Fischer, V.3
Ivers-Tiffée, E.4
Gerthsen, D.5
-
6
-
-
41849090718
-
Phase transition in niobium pentoxide supported on silica-alumina
-
June (3)
-
Braga V., Garcia F., Dias J., Dias S. Phase transition in niobium pentoxide supported on silica-alumina. Journal of Thermal Analysis and Calorimetry 2008, 92(June (3)):851-855.
-
(2008)
Journal of Thermal Analysis and Calorimetry
, vol.92
, pp. 851-855
-
-
Braga, V.1
Garcia, F.2
Dias, J.3
Dias, S.4
-
7
-
-
35949019495
-
5 at elevated temperature in air and flowing argon
-
Out (7)
-
5 at elevated temperature in air and flowing argon. Physical Review B 1982, 26(Out (7)):3954.
-
(1982)
Physical Review B
, vol.26
, pp. 3954
-
-
Vezzoli, G.C.1
-
9
-
-
0000841112
-
Niobium compounds: preparation, characterization, and application in heterogeneous catalysis
-
Dez (12)
-
Nowak I., Ziolek M. Niobium compounds: preparation, characterization, and application in heterogeneous catalysis. Chemical Reviews 1999, 99(Dez (12)):3603-3624.
-
(1999)
Chemical Reviews
, vol.99
, pp. 3603-3624
-
-
Nowak, I.1
Ziolek, M.2
-
11
-
-
0037388474
-
Niobium pentoxide prepared by soft chemical routes: morphology, structure, defects and quantum size effect
-
Brayner R., Bozon-Verduraz F. Niobium pentoxide prepared by soft chemical routes: morphology, structure, defects and quantum size effect. Physical Chemistry Chemical Physics 2003, 5(7):1457-1466.
-
(2003)
Physical Chemistry Chemical Physics
, vol.5
, Issue.7
, pp. 1457-1466
-
-
Brayner, R.1
Bozon-Verduraz, F.2
-
12
-
-
3042665758
-
Characteristics of rutile single crystals grown under two different oxygen partial pressures
-
July (1-2)
-
Park J.K., Kim K.H., Tanaka I., Shim K.B. Characteristics of rutile single crystals grown under two different oxygen partial pressures. Journal of Crystal Growth 2004, 268(July (1-2)):103-107.
-
(2004)
Journal of Crystal Growth
, vol.268
, pp. 103-107
-
-
Park, J.K.1
Kim, K.H.2
Tanaka, I.3
Shim, K.B.4
-
13
-
-
4344562849
-
High-speed float zone growth of rutile single crystals inclined at 48° to the c-axis
-
Set (2-4)
-
Higuchi M., Sato C., Kodaira K. High-speed float zone growth of rutile single crystals inclined at 48° to the c-axis. Journal of Crystal Growth 2004, 269(Set (2-4)):342-346.
-
(2004)
Journal of Crystal Growth
, vol.269
, pp. 342-346
-
-
Higuchi, M.1
Sato, C.2
Kodaira, K.3
-
15
-
-
0015401636
-
Photoconductivity and photoluminescence in amorphous titanium dioxide
-
June
-
Deb S.K. Photoconductivity and photoluminescence in amorphous titanium dioxide. Solid State Communications 1972, 11(June):713-715.
-
(1972)
Solid State Communications
, vol.11
, pp. 713-715
-
-
Deb, S.K.1
-
16
-
-
36149008514
-
Optical properties and band structure of wurtzite-type crystals and rutile
-
October (5A)
-
Cardona M., Gunther H. Optical properties and band structure of wurtzite-type crystals and rutile. Physical Review 1965, 137(October (5A)):A1467-A1476.
-
(1965)
Physical Review
, vol.137
-
-
Cardona, M.1
Gunther, H.2
-
17
-
-
0026119285
-
Formation and characterization of thin film vanadium oxides: Auger electron spectroscopy, X-ray photoelectron spectroscopy, X-ray diffraction, scanning electron microscopy, and optical reflectance studies
-
September
-
Moshfegh A.Z., Ignatiev A. Formation and characterization of thin film vanadium oxides: Auger electron spectroscopy, X-ray photoelectron spectroscopy, X-ray diffraction, scanning electron microscopy, and optical reflectance studies. Thin Solid Films 1991, 198(September):251-268.
-
(1991)
Thin Solid Films
, vol.198
, pp. 251-268
-
-
Moshfegh, A.Z.1
Ignatiev, A.2
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