Anodically formed oxide films on niobium: Microstructural and electrical properties

Journal of the European Ceramic Society

Volumn 29, Issue 9, 2009, Pages 1743-1753

  Stormer H ^a   Weber, A ^a   Fischer, V ^a   Ivers Tiffee E ^a   Gerthsen, D ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

Capacitor; Electrical properties; Electron microscopy; Nb2O5

Indexed keywords

ANODIZATION; BIAS DEPENDENCES; BIAS-VOLTAGE; DIELECTRIC LAYERS; ELECTRICAL AND STRUCTURAL PROPERTIES; ELECTRICAL PROPERTIES; MICRO-STRUCTURAL; MICROSCOPIC TECHNIQUES; NANO-SCALE; NB2O5; NIOBIUM PENTOXIDES; POWDER COMPACTS; PROCESSING STEPS; PRODUCTION PROCESS; SOLID ELECTROLYTE CAPACITORS; SPECIFIC CAPACITANCES;

ANODIC OXIDATION; CAPACITANCE; CAPACITANCE MEASUREMENT; CAPACITORS; ELECTROLYTIC CAPACITORS; HEAT TREATMENT; OXIDE FILMS; SOLID ELECTROLYTES; TRANSITION METALS;

NIOBIUM;

EID: 64449088405     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2008.10.019     Document Type: Article

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