In situ Hall effect measurement on diamond anvil cell under high pressure

Review of Scientific Instruments

Volumn 81, Issue 11, 2010, Pages

  Hu, Tingjing ^a   Cui, Xiaoyan ^a,b   Gao, Yang ^a   Han, Yonghao ^a   Liu, Cailong ^a   Liu, Bao ^a   Liu, Hongwu ^a   Ma, Yanzhang ^c   Gao, Chunxiao ^a  

^a JILIN UNIVERSITY   (China)

^b JILIN NORMAL UNIVERSITY   (China)

^c Texas Tech University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRECTION FACTORS; DIAMOND ANVIL; DIAMOND-ANVIL CELL; HALL COEFFICIENT; HALL EFFECT MEASUREMENT; HIGH PRESSURE; IN-SITU; STRONG MAGNETIC FIELDS; VOLTAGE ERROR;

DIAMONDS; GYRATORS; HALL EFFECT; HIGH PRESSURE EFFECTS; HIGH PRESSURE ENGINEERING; MEASUREMENT ERRORS; TOOLS; ZINC COMPOUNDS;

MAGNETIC FIELD EFFECTS;

EID: 78650280255     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3501384     Document Type: Article

References (37)

1. T. Takahashi and W. A. Bassett, Science SCIEAS 0036-8075 145, 483 (1964). 10.1126/science.145.3631.483
2. J. F. Lin, J. F. Shu, H. K. Mao, R. J. Hemley, and G. Y. Shen, Rev. Sci. Instrum. RSINAK 0034-6748 74, 4732 (2003). 10.1063/1.1621065
3. D. M. Adams, S. J. Payne, and K. Martin, Appl. Spectrosc. APSPA4 0003-7028 27, 377 (1973). 10.1366/000370273774333353
4. Q. Zhou, Y. Z. Ma, Q. L. Cui, T. Cui, J. Zhang, Y. L. Xie, K. F. Yang, and G. T. Zou, Rev. Sci. Instrum. RSINAK 0034-6748 75, 2432 (2004). 10.1063/1.1763260
5. J. Y. Zhao, T. S. Toellner, M. Y. Hu, W. Sturhahn, E. E. Alp, G. Y. Shen, and H. K. Mao, Rev. Sci. Instrum. RSINAK 0034-6748 73, 1608 (2002). 10.1063/1.1445822 (Pubitemid 34406297)
6. P. Postorino, A. Congeduti, P. Dore, A. Sacchetti, F. Gorelli, L. Ulivi, A. Kumar, and D. D. Sarma, Phys. Rev. Lett. PRLTAO 0031-9007 91, 175501 (2003). 10.1103/PhysRevLett.91.175501
7. B. Welber, Rev. Sci. Instrum. RSINAK 0034-6748 47, 183 (1976). 10.1063/1.1134586
8. L. J. van der Pauw, Philips Tech. Rev. PTREAN 0031-7926 20, 220 (1958).
9. D. Long, Phys. Rev. PHRVAO 0031-899X 99, 388 (1955). 10.1103/PhysRev.99. 388
10. J. R. Vaišnys and R. S. Kirk, Rev. Sci. Instrum. RSINAK 0034-6748 36, 1799 (1965). 10.1063/1.1719468
11. E. Rapoport, J. Chem. Phys. JCPSA6 0021-9606 48, 1433 (1968). 10.1063/1.1668858
12. A. K. Saxena, Appl. Phys. Lett. APPLAB 0003-6951 36, 79 (1980). 10.1063/1.91281
13. D. W. Harrison, K. C. Lim, J. D. Thompson, C. Y. Huang, P. D. Hambourger, and H. L. Luo, Phys. Rev. Lett. PRLTAO 0031-9007 46, 280 (1981). 10.1103/PhysRevLett.46.280
14. H. Boppart and P. Wachter, Phys. Rev. Lett. PRLTAO 0031-9007 53, 1759 (1984). 10.1103/PhysRevLett.53.1759
15. D. Errandonea, A. Segura, D. Martínez-García, and V. Muoz-San Jose, Phys. Rev. B PLRBAQ 0556-2805 79, 125203 (2009). 10.1103/PhysRevB.79.125203
16. D. Patel, T. E. Crumbaker, J. R. Sites, and I. L. Spain, Rev. Sci. Instrum. RSINAK 0034-6748 57, 2795 (1986). 10.1063/1.1139045
17. T. Yamauchi, K. Shimizu, N. Takeshita, M. Ishizuka, K. Amaya, and S. Endo, J. Phys. Soc. Jpn. JUPSAU 0031-9015 63, 3207 (1994). 10.1143/JPSJ.63.3207
18. S. T. Weir, J. Akella, C. Aracne-Ruddle, Y. K. Vohra, and S. A. Catledge, Appl. Phys. Lett. APPLAB 0003-6951 77, 3400 (2000). 10.1063/1.1326838
19. N. Velisavljevic and Y. K. Vohra, Appl. Phys. Lett. APPLAB 0003-6951 82, 4271 (2003). 10.1063/1.1584076
20. Y. H. Han, C. X. Gao, Y. Z. Ma, H. W. Liu, Y. W. Pan, J. F. Luo, M. Li, C. Y. He, X. W. Huang, G. T. Zou, Y. C. Li, X. D. Li, and J. Liu, Appl. Phys. Lett. APPLAB 0003-6951 86, 064104 (2005). 10.1063/1.1863444 (Pubitemid 40661657)
21. C. X. Gao, Y. H. Han, Y. Z. Ma, A. White, H. W. Liu, J. F. Luo, M. Li, C. Y. He, A. M. Hao, X. W. Huang, Y. W. Pan, and G. T. Zou, Rev. Sci. Instrum. RSINAK 0034-6748 76, 083912 (2005). 10.1063/1.2006347 (Pubitemid 41421325)
22. G. D. Pitt, J. Sci. Instrum. JSINAY 0950-7671 1, 915 (1968). 10.1088/0022-3735/1/9/305
23. M. Li, C. X. Gao, G. Peng, C. Y. He, A. M. Hao, X. W. Huang, D. M. Zhang, C. L. Yu, Y. Z. Ma, and G. T. Zou, Rev. Sci. Instrum. RSINAK 0034-6748 78, 075106 (2007). 10.1063/1.2754399 (Pubitemid 47192276)
24. A. San Miguel, A. Polian, and J. P. Ití, J. Phys. Chem. Solids JPCSAW 0022-3697 56, 555 (1995). 10.1016/0022-3697(94)00238-X
25. G. D. Lee and J. Ihm, Phys. Rev. B PLRBAQ 0556-2805 53, R7622 (1996). 10.1103/PhysRevB.53.R7622
26. M. Côt́, O. Zakharov, A. Rubio, and M. L. Cohen, Phys. Rev. B PLRBAQ 0556-2805 55, 13025 (1997). 10.1103/PhysRevB.55.13025
27. A. San-Miguel, A. Polian, M. Ganthier, and J. P. Ití, Phys. Rev. B PLRBAQ 0556-2805 48, 8683 (1993). 10.1103/PhysRevB.48.8683
28. J. Camacho, I. Loa, A. Cantarero, and K. Syassen, J. Phys.: Condens. Matter JCOMEL 0953-8984 14, 739 (2002). 10.1088/0953-8984/14/4/309 (Pubitemid 34153768)
29. S. V. Ovsyannikov and V. V. Shchennikov, Solid State Commun. SSCOA4 0038-1098 132, 333 (2004). 10.1016/j.ssc.2004.07.062
30. R. Franco, P. Mori-Sánchez, J. M. Recio, and R. Pandey, Phys. Rev. B PLRBAQ 0556-2805 68, 195208 (2003). 10.1103/PhysRevB.68.195208
31. A. Onodera, A. Ohtani, S. Tsuduki, and O. Shimomura, Solid State Commun. SSCOA4 0038-1098 145, 374 (2008). 10.1016/j.ssc.2007.11.020
32. R. J. Nelmes, M. I. McMahon, N. G. Wright, and D. R. Allan, Phys. Rev. Lett. PRLTAO 0031-9007 73, 1805 (1994). 10.1103/PhysRevLett.73.1805
33. A. Ohtani, M. Motobayashi, and A. Onodera, Phys. Lett. A PYLAAG 0375-9601 75, 435 (1980). 10.1016/0375-9601(80)90866-X
34. S. Endo, A. Yoneda, M. Ichikawa, S. Tanaka, and S. Kawabe, J. Phys. Soc. Jpn. JUPSAU 0031-9015 51, 138 (1982). 10.1143/JPSJ.51.138
35. M. M. Li, D. J. Strachan, T. M. Ritter, M. Tamargo, and B. A. Weinstein, Phys. Rev. B PLRBAQ 0556-2805 50, 4385 (1994). 10.1103/PhysRevB.50.4385
36. B. A. Weinstein, T. M. Ritter, D. Stracha, M. Li, H. Luo, M. Tamarg, and R. Park, Phys. Status Solidi B PSSBBD 0370-1972 198, 167 (1996). 10.1002/pssb.2221980123
37. V. Iota and B. A. Weinstein, Phys. Rev. Lett. PRLTAO 0031-9007 81, 4955 (1998). 10.1103/PhysRevLett.81.4955