Integrated microcircuit on a diamond anvil for high-pressure electrical resistivity measurement

Applied Physics Letters

Volumn 86, Issue 6, 2005, Pages 1-3

  Han, Yonghao ^a,b,c   Gao, Chunxiao ^a,b,c   Ma, Yanzhang ^a,b,c   Liu, Hongwu ^a,c   Pan, Yuewu ^a,c   Luo, Jifeng ^a,c   Li, Ming ^a,c   He, Chunyuan ^a,c   Huang, Xiaowei ^a,c   Zou, Guangtian ^a,c   Li, Yanchun ^c   Li, Xiaodong ^c   Liu, Jing ^c  

^a JILIN UNIVERSITY   (China)

^b Department of Electrical and Computer Engineering   (United States)

^c INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; DEPOSITION; DIAMONDS; ELECTRIC REACTANCE MEASUREMENT; ENCAPSULATION; INSULATION; PHASE TRANSITIONS; PRESSURE EFFECTS; SEMICONDUCTOR MATERIALS; ZINC SULFIDE;

DIAMOND ANVIL CELL (DAC); DIAMOND SURFACES; FILM DEPOSITION TECHNIQUES; MICROCIRCUITS;

INTEGRATED CIRCUITS;

EID: 20844436314     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1863444     Document Type: Article

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