Synchrotron X-ray diffraction study of ZnTe at high pressure

Solid State Communications

Volumn 145, Issue 7-8, 2008, Pages 374-378

  Onodera, A ^a   Ohtani, A ^a   Tsuduki, S ^a   Shimomura, O ^b  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

A. Semiconductors; C. X ray scattering; D. Crystal binding and equation of state; D. Phase transitions

Indexed keywords

DIAMONDS; EQUATIONS OF STATE; HIGH PRESSURE EFFECTS IN SOLIDS; PHASE TRANSITIONS; SEMICONDUCTOR MATERIALS; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

CRYSTAL BINDINGS; IMAGING PLATE DETECTORS;

ZINC COMPOUNDS;

EID: 38549142432     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2007.11.020     Document Type: Article

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