ToF-SIMS and XPS study of ancient papers

Applied Surface Science

Volumn 257, Issue 6, 2011, Pages 2142-2147

  Benetti, Francesca ^a   Marchettini, Nadia ^a   Atrei, Andrea ^a  

^a UNIVERSITY OF SIENA   (Italy)

Author keywords

Ancient paper; Surface analysis; ToF SIMS; XPS

Indexed keywords

LUNAR SURFACE ANALYSIS; SURFACE ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

CELLULOSE FIBER; GEOGRAPHICAL AREA; HANDMADE PAPERS; HARDENING AGENT; MANUFACTURING PROCESS; STATE OF CONSERVATIONS; SURFACE SENSITIVE METHODS; TOF SIMS;

SECONDARY ION MASS SPECTROMETRY;

ESCA; MASS SPECTROMETERS; PAPER MILLS; PULP MILLS; SURFACE PROPERTIES; X RAY SPECTROSCOPY;

EID: 78650276429     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.09.063     Document Type: Article

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