Time-temperature-transformation measurements of FePt thin films in the millisecond regime using pulse laser processing

Journal of Applied Physics

Volumn 108, Issue 10, 2010, Pages

  Inaba, Yuki ^a   Zana, Iulica ^a,b   Swartz, Caleb ^c   Kubota, Yukiko ^d   Klemmer, Tim ^d   Harrell, J W ^a   Thompson, Gregory B ^a,e  

^a UNIVERSITY OF ALABAMA   (United States)

^b WESTERN DIGITAL CORPORATION   (United States)

^c BELMONT UNIVERSITY   (United States)

^d SEAGATE TECHNOLOGY   (United States)

^e University of Alabama   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

1064 NM; ATOMIC DIFFUSIONS; FEPT THIN FILMS; OPTICAL PYROMETERS; ORDER PARAMETER; PARTIAL ORDERING; PLATINUM THIN FILM; PULSE LASER; TEMPERATURE PROFILES; TEMPERATURE-TIME PROFILES; THEORETICAL PREDICTION; THERMAL PULSE; TIME DEPENDENCE; TIME TEMPERATURE TRANSFORMATION; TIME-TEMPERATURE-TRANSFORMATION CURVES; TTT DIAGRAM; YTTRIUM ALUMINUM GARNET LASER;

PLATINUM; PYROMETERS; SILICATE MINERALS; THIN FILMS; YTTRIUM;

PULSED LASERS;

EID: 78650274727     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3506689     Document Type: Conference Paper

References (33)

1. D. Weller, A. Moser, L. Folks, M. E. Best, L. Wen, M. F. Toney, M. Schwicker, J. -U. Thiele, and M. F. Doerner, IEEE Trans. Magn. IEMGAQ 0018-9464 36, 10 (2000). 10.1109/20.824418
2. B. Rellinghaus, E. Mohn, L. Schultz, T. Gemming, M. Acet, A. Kowalik, and B. F. Kock, IEEE Trans. Magn. IEMGAQ 0018-9464 42, 3048 (2006). 10.1109/TMAG.2006.880087 (Pubitemid 46179641)
3. D. C. Berry and K. Barmak, J. Appl. Phys. JAPIAU 0021-8979 101, 014905 (2007). 10.1063/1.2403835 (Pubitemid 46120711)
4. Y. Inaba, G. B. Thompson, J. W. Harrell, T. Klemmer, and Y. Kubota, J. Appl. Phys. JAPIAU 0021-8979 107, 053507 (2010). 10.1063/1.3318492
5. Y. Inaba, S. Kang, G. B. Thompson, J. R. Izatt, I. Zana, J. W. Harrell, Y. Kubota, and T. J. Klemmer, J. Appl. Phys. JAPIAU 0021-8979 105, 07B715 (2009). 10.1063/1.3068529
6. Corning 1737 AM LCD Glass Substrates Material Information (http://www.delta-technologies.com/downloads/Corning%201737.pdf)
7. K. L. Torres and G. B. Thompson, Ultramicroscopy ULTRD6 0304-3991 109, 606 (2009). 10.1016/j.ultramic.2008.10.029
8. M. A. Ordal, L. L. Long, R. J. Bell, S. E. Bell, R. R. Bell, R. W. Alexander, and C. A. Ward, Appl. Opt. APOPAI 0003-6935 22, 1099 (1983). 10.1364/AO.22.001099
9. K. Sato, A. Mizusawa, K. Ishida, T. Shima, and K. Takanashi, Trans. Magn. Soc. Jpn. TMSJB5 1346-7948 4, 297 (2004).
10. O. S. Heavens, Optical Properties of Thin Solid Films (Butterworth, London, 1955), pp. 76-77.
11. J. Buschbeck, S. Fähler, M. Weisheit, K. Leistner, J. McCord, B. Rellinghaus, and L. Schultz, J. Appl. Phys. JAPIAU 0021-8979 100, 123901 (2006). 10.1063/1.2397294 (Pubitemid 46058173)
12. J. W. Arblaster, Platinum Metals Rev. PTMRA3 0032-1400 38, 119 (1994).
13. Y. Terada, K. Ohkubo, T. Mohri, and T. Suzuki, J. Alloys Compd. JALCEU 0925-8388 285, 233 (1999). 10.1016/S0925-8388(98)01042-1
14. L. A. Giannuzzi, J. L. Drown, S. R. Brown, R. B. Irwin, and F. A. Stevie, Microsc. Res. Tech. MRTEEO 1059-910X 41, 285 (1998). 10.1002/(SICI)1097- 0029(19980515)41:4<285::AID-JEMT13.0.CO;2-Q
15. Y. Inaba, K. L. Torres, S. Kang, R. Vanfleet, J. R. Izatt, J. W. Harrell, G. B. Thompson, T. Klemmer, and Y. Kubota, J. Magn. Magn. Mater. JMMMDC 0304-8853 322, 3828 (2010). 10.1016/j.jmmm.2010.07.035
16. J. Trice, D. Thomas, C. Favazza, R. Sureshkumar, and R. Kalyanaraman, Phys. Rev. B PLRBAQ 0556-2805 75, 235439 (2007). 10.1103/PhysRevB.75.235439
17. T. Bk, Appl. Opt. APOPAI 0003-6935 21, 1069 (1982). 10.1364/AO.21.001069
18. G. D. Mahan and D. T. F. Marple, Appl. Phys. Lett. APPLAB 0003-6951 42, 219 (1983). 10.1063/1.93898
19. G. Hanreich and J. Nicolics, Proceedings of the IEEE Instrument and Measurement Technology Conference, Budapest, Hungary, 21-23 May 2001, pp. 1045-1050.
20. H. -T. Chen and J. -C. Chou, Int. J. Heat Mass Transfer IJHMAK 0017-9310 49, 3034 (2006). 10.1016/j.ijheatmasstransfer.2006.02.009 (Pubitemid 43902831)
21. L. E. Greenwald, E. M. Breinan, and B. H. Kear, AIP Conf. Proc. APCPCS 0094-243X 50, 189 (1979). 10.1063/1.31658
22. http://www.comsol.com
23. N. Semmar and C. Boulmer-Leborgne, J. Phys. IV France JPICEI 1155-4339 120, 413 (2004).
24. N. Zotov, J. Feydt, A. Savan, and A. Ludwig, J. Appl. Phys. JAPIAU 0021-8979 100, 073517 (2006). 10.1063/1.2355552 (Pubitemid 44570669)
25. M. Rennhofer, B. Sepiol, M. Sladecek, D. Kmiec, S. Stankov, G. Vogl, M. Kozlowski, R. Kozubski, A. Vantomme, J. Meersschaut, R. Rüffer, and A. Gupta, Phys. Rev. B PLRBAQ 0556-2805 74, 104301 (2006). 10.1103/PhysRevB.74. 104301 (Pubitemid 44403803)
26. J. Kučera and B. Million, Phys. Status Solidi A PSSABA 0031-8965 31, 275 (1975). 10.1002/pssa.2210310131
27. B. E. Warren, X-Ray Diffraction (Addison-Wesley, Reading, MA, 1969).
28. R. A. Ristau, K. Barmak, L. H. Lewis, K. R. Coffey, and J. K. Howard, J. Appl. Phys. JAPIAU 0021-8979 86, 4527 (1999). 10.1063/1.371397
29. C. Srivastava, J. Balasubramanian, C. H. Turner, D. E. Nikles, J. Wiest, and G. B. Thompson, J. Appl. Phys. JAPIAU 0021-8979 102, 104310 (2007). 10.1063/1.2816227 (Pubitemid 350199484)
30. F. Cardavelli, Materials Handbook (Springer-Verlag, London, 2000).
31. A. S. Okhotin, A. S. Pushkarskii, and V. V. Gorbachev, Thermophysical Properties of Semiconductors (Atom, Moscow, 1972).
32. C. J. Glassbrenner and G. A. Slack, Phys. Rev. PHRVAO 0031-899X 134, A1058 (1964). 10.1103/PhysRev.134.A1058
33. D. E. Aspnes, in Properties of Crystalline Silicon, EMIS Datareviews No. 20, edited by, R. Hull, (INSPEC, London, 1999), p. 684.