Annealing-induced amorphization in a sputtered glass-forming film: In-situ transmission electron microscopy observation

Surface and Coatings Technology

Volumn 205, Issue 8-9, 2011, Pages 2914-2918

  Chu, Jinn P ^a   Wang, Chiu Yen ^b   Chen, L J ^b   Chen, Qi ^c  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Amorphization; Metallic glass; Sputtered thin film

Indexed keywords

AMORPHOUS MATRICES; EX-SITU ATOMIC FORCE MICROSCOPY; GLASS-FORMING; HIGHER TEMPERATURES; IN-SITU TRANSMISSION; LOW TEMPERATURES; SPUTTERED THIN FILMS; SUPERCOOLED LIQUID REGION; X RAY DIFFRACTOMETRY;

AMORPHIZATION; ANNEALING; ATOMIC FORCE MICROSCOPY; FILM GROWTH; GLASS; HEATING; METALLIC GLASS; NANOCRYSTALLIZATION; SUPERCOOLING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

AMORPHOUS FILMS;

EID: 78650213600     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2010.10.065     Document Type: Article

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