Annealing-induced amorphization in a glass-forming thin film

JOM

Volumn 61, Issue 1, 2009, Pages 72-75

  Chu, J P ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATRICES; AMORPHOUS STRUCTURES; AS-DEPOSITED FILMS; COPPER-BASED; ELECTRICAL RESISTIVITY; EXPERIMENTAL EVIDENCE; GLASS-FORMING; IRON-BASED; MULTICOMPONENT; NANO SCALE; SOLID-STATE AMORPHIZATION; SUPERCOOLED LIQUID REGION;

ANNEALING; ELECTRIC RESISTANCE; GLASS; METALLIC GLASS; SUPERCOOLING; TRANSMISSION ELECTRON MICROSCOPY; ZIRCONIUM;

AMORPHIZATION;

EID: 67649432599     PISSN: 10474838     EISSN: 15431851     Source Type: Journal    
DOI: 10.1007/s11837-009-0014-x     Document Type: Article

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