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Volumn 43, Issue 48, 2010, Pages

Intrinsic defects and their influence on the chemical and optical properties of TiO2-x films

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL COMPOSITIONS; ENERGY BAND STRUCTURE; FEED GAS; INTRINSIC DEFECTS; OPTICAL SPECTROSCOPY; OXYGEN CONTENT; OXYGEN PLASMAS; RF-SPUTTERING; RUTHERFORD BACK-SCATTERING SPECTROMETRY; STRUCTURE OF FILMS; TIO; XPS;

EID: 78650156220     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/43/48/485402     Document Type: Article
Times cited : (50)

References (42)
  • 15
    • 46449090235 scopus 로고    scopus 로고
    • Wendt S et al 2008 Science 320 1755
    • (2008) Science , vol.320 , pp. 1755
    • Wendt, S.1
  • 30
    • 0003972070 scopus 로고    scopus 로고
    • 7th edn Cambridge: Cambridge University Press
    • Born M and Wolf E 1999 Principles of Optics 7th edn (Cambridge: Cambridge University Press)
    • (1999) Principles of Optics
    • Born, M.1    Wolf, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.