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Volumn 43, Issue 48, 2010, Pages
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Intrinsic defects and their influence on the chemical and optical properties of TiO2-x films
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL COMPOSITIONS;
ENERGY BAND STRUCTURE;
FEED GAS;
INTRINSIC DEFECTS;
OPTICAL SPECTROSCOPY;
OXYGEN CONTENT;
OXYGEN PLASMAS;
RF-SPUTTERING;
RUTHERFORD BACK-SCATTERING SPECTROMETRY;
STRUCTURE OF FILMS;
TIO;
XPS;
ARGON;
BAND STRUCTURE;
DEFECTS;
OXYGEN;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
X RAY DIFFRACTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
OPTICAL PROPERTIES;
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EID: 78650156220
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/43/48/485402 Document Type: Article |
Times cited : (50)
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References (42)
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