Tracking hydroxyl adsorption on TiO 2 (1 1 0) through secondary emission changes

Applied Surface Science

Volumn 255, Issue 16, 2009, Pages 7389-7393

  Marques, H P ^a   Canario A R ^a   Moutinho, A M C ^a   Teodoro, O M N D ^a  

^a UNIVERSIDADE NOVA DE LISBOA   (Portugal)

Author keywords

Hydroxyl adsorption; Secondary electron emission measurements; Titanium oxide; Work function measurements

Indexed keywords

ADSORPTION; ELECTRIC FIELDS; OXIDE MINERALS; SCANNING TUNNELING MICROSCOPY; SURFACE DEFECTS; TITANIUM DIOXIDE; TITANIUM OXIDES; WORK FUNCTION;

DEFECT CONCENTRATIONS; SECONDARY ELECTRON EMISSION MEASUREMENT; SECONDARY ELECTRON EMISSIONS; SECONDARY ELECTRONS; SURFACE ELECTRIC FIELDS; SURFACE PREPARATION; WATER PARTIAL PRESSURE; WORK FUNCTION MEASUREMENTS;

SECONDARY EMISSION;

EID: 67349239328     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.04.006     Document Type: Article

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