Robustness evaluation of high voltage Press Pack IGBT modules in enhanced short circuit test

2010 IEEE Energy Conversion Congress and Exposition, ECCE 2010 - Proceedings

Volumn , Issue , 2010, Pages 92-99

  Hermansson, W ^a   Chimento, F ^a   Jonsson, T ^a  

^a ABB CORPORATE RESEARCH   (Sweden)

Author keywords

Failure; IGBT; Short circuit

Indexed keywords

EXPERIMENTAL TEST; FAILURE; HIGH POWER CONVERTERS; HIGH VOLTAGE; HIGH-POWER; IGBT; PRESS PACK; REAL CIRCUITS; ROBUSTNESS EVALUATION; SHORT CIRCUIT; SHORT CIRCUIT TESTS; SHORT-CIRCUIT CONDITIONS; TEMPERATURE CONDITIONS;

ENERGY CONVERSION; METAL STAMPING; PRESSES (MACHINE TOOLS); RATING;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

EID: 78650130744     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECCE.2010.5618068     Document Type: Conference Paper

References (11)

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