Correlation between preparation parameters and properties of molybdenum back contact layer for CIGS thin film solar cell

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2010, Pages 2478-2482

  Takahashi, Eigo ^a   Pethe, Shirish A ^a   Dhere, Neelkanth G ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE STRENGTH; AVERAGE SURFACE ROUGHNESS; BACK CONTACT; BENDING BEAM; CIGS SOLAR CELLS; CIGS THIN FILMS; DIRECT CURRENT; ELECTRICAL PROPERTY; FOUR-POINT PROBE; GLASS SUBSTRATES; LOW RESISTIVITY; MINIMUM VALUE; MULTI-LAYERED; OPTICAL REFLECTANCE; PLANAR MAGNETRON; PREPARATION PARAMETERS; PROCESS PARAMETERS; PROFILOMETERS; SINGLE LAYER; SODA LIME GLASS SUBSTRATE; SPUTTERING POWER; THIN GLASS; WORKING GAS PRESSURE;

ADHESION; BEAMS AND GIRDERS; BENDING (FORMING); COPPER COMPOUNDS; DC POWER TRANSMISSION; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; FILM PREPARATION; GALLIUM; GLASS; MECHANICAL PROPERTIES; MOLYBDENUM; MORPHOLOGY; PHOTOVOLTAIC EFFECTS; SHEET RESISTANCE; SOLAR CELLS; STRESS ANALYSIS; SUBSTRATES; SURFACE ROUGHNESS; TENSILE STRESS; THIN FILMS; VAPOR DEPOSITION;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 78650122290     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2010.5614740     Document Type: Conference Paper

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