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Volumn , Issue , 2010, Pages 2089-2092

Optimization of the p-GaN window layer for InGaN/GaN solar cells

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL PERFORMANCE; INGAN/GAN; OPTIMIZED DEVICES; PEAK OUTPUT POWER; REVERSE BIAS; SHORT WAVELENGTHS; SURFACE PIT DENSITIES; THREE ORDERS OF MAGNITUDE; WINDOW LAYER;

EID: 78650111921     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2010.5616061     Document Type: Conference Paper
Times cited : (7)

References (8)
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  • 2
    • 53749099094 scopus 로고    scopus 로고
    • High quantum efficiency InGaN/GaN solar cells with 2.95 eV band gap
    • C.J. Neufeld et al., "High quantum efficiency InGaN/GaN solar cells with 2.95 eV band gap", Appl. Phys. Lett. 93, 2008, pp. 143502-1.
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    • Neufeld, C.J.1
  • 3
    • 60349107985 scopus 로고    scopus 로고
    • InGaN/GaN multiple quantum well solar cells with long operating wavelengths
    • R. Dahal, et al., "InGaN/GaN multiple quantum well solar cells with long operating wavelengths", Appl. Phys. Lett. 94, 2009, p. 063505.
    • (2009) Appl. Phys. Lett. , vol.94 , pp. 063505
    • Dahal, R.1
  • 4
    • 70350702606 scopus 로고    scopus 로고
    • Fabrication and characterization of InGaN p-i-n homojunction solar cell
    • X. Cai et al., "Fabrication and characterization of InGaN p-i-n homojunction solar cell", Appl. Phys. Lett. 95, 2009, p. 173504.
    • (2009) Appl. Phys. Lett. , vol.95 , pp. 173504
    • Cai, X.1
  • 5
    • 79955992797 scopus 로고    scopus 로고
    • Optical bandgap energy of wurtzite InN
    • T. Matsuoka, et al., "Optical bandgap energy of wurtzite InN", Appl. Phys. Lett. 81, 2002, p. 1246.
    • (2002) Appl. Phys. Lett. , vol.81 , pp. 1246
    • Matsuoka, T.1
  • 6
    • 36448999228 scopus 로고
    • Study of defect states in GaN films by photoconductivity measurement
    • C.H. Qiu et al., "Study of defect states in GaN films by photoconductivity measurement", Appl. Phys. Lett. 66, 1995, pp. 2712-2714.
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 2712-2714
    • Qiu, C.H.1
  • 7
    • 1342306674 scopus 로고    scopus 로고
    • Microstructural origin of leakage current in GaN/InGaN light-emitting diodes
    • X. Cao et al., "Microstructural origin of leakage current in GaN/InGaN light-emitting diodes", J. of Cryst. Growth 264, 2004, pp. 172-177.
    • (2004) J. of Cryst. Growth , vol.264 , pp. 172-177
    • Cao, X.1
  • 8
    • 21544482023 scopus 로고    scopus 로고
    • Structural origin of V-defects and correlation with localized excitonic centers in InGaN/GaN multiple quantum wells
    • X.H. Wu et al., "Structural origin of V-defects and correlation with localized excitonic centers in InGaN/GaN multiple quantum wells", Appl. Phys. Lett. 72, 1998, pp. 692-694.
    • (1998) Appl. Phys. Lett. , vol.72 , pp. 692-694
    • Wu, X.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.