Grain yield stability and molecular characterization of durum wheat genotypes under heat stress conditions

African Journal of Agricultural Research

Volumn 5, Issue 22, 2010, Pages 3065-3074

  Al Doss, Abdullah Abdlulaziz ^a,b   Saleh, Mohamed ^b   Moustafa, Khaled Ahmed ^b   Elshafei, Adel Ahmed ^a   Barakat, Mohamed Najeb ^a  

^a Center of Excellence in Biotechnology Research   (Saudi Arabia)

^b KING SAUD UNIVERSITY   (Saudi Arabia)

Author keywords

Durum wheat; Genetic diversity; Heat tolerance; Srap markers; Trap markers; Yields stability

Indexed keywords

TRITICUM AESTIVUM; TRITICUM TURGIDUM SUBSP. DURUM;

EID: 78650094197     PISSN: None     EISSN: 1991637X     Source Type: Journal    
DOI: None     Document Type: Article

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