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Volumn , Issue , 2010, Pages 3076-3083

Analysis of IGBT power cycling capabilities used in doubly fed induction generator wind power system

Author keywords

Tj control; Adjustable speed drive; Doubly fed induction generator; MTTF; Power cycling capability

Indexed keywords

ADJUSTABLE SPEED DRIVES; CURRENT-CONTROL METHOD; DOUBLY FED INDUCTION GENERATORS; DOUBLY-FED INDUCTION GENERATOR; GRID FREQUENCY; LARGE SYSTEM; MTTF; POWER APPLICATIONS; POWER CYCLE; POWER CYCLING; ROTOR-SIDE CONVERTER; SLIP FREQUENCY; SLIP POWER; WHOLE SYSTEMS; WIND POWER SYSTEMS;

EID: 78650090124     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECCE.2010.5618396     Document Type: Conference Paper
Times cited : (9)

References (14)
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  • 4
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    • Mauro Ciappa, Flavio Carbognani, Wolfgang Fichner, " MTTF prediction and design of reliability tests for high power devices in automotive applications, IEEE Trans. on Device and Materials Reliability, Vol.3, No.4, Dec, 2003, pp.191-196.
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  • 5
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    • Abhijit Dasgupta, "Failure mechanism models for cyclic fatigue", IEEE Transactions on Reliability, Vol.42, No.4, 1993, Dec. 2007.
    • (2007) IEEE Transactions on Reliability , vol.42 , Issue.4
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  • 7
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    • Fast power cycling test for IGBT modules in traction application
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    • Proc IEEE APEC 1997
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  • 8
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    • Lifetime prediction and design of reliability tests for high power devices in automotive applications
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    • Mauro Ciappa, Flavio Carbognani, Wolfgang Fichtner, : "Lifetime prediction and design of reliability tests for high power devices in automotive applications", IEEE Trans. on Device and Materials reliability, Vol.3, No.4, Dec, 2003.
    • (2003) IEEE Trans. on Device and Materials Reliability , vol.3 , Issue.4
    • Ciappa, M.1    Carbognani, F.2    Fichtner, W.3
  • 9
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    • Failure machanism models for cyclic fatigue
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    • Abhijit Dasgupta, "Failure machanism models for cyclic fatigue", IEEE Trans. on Reliability, Vol. 42, No.4, Dec, 1993.
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  • 11
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    • Junction temperature prediction of a multi-chip IGBT module under DC condition
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    • Lixiang Wei, Russ J Kerkman, and etc, "Junction temperature prediction of a multi-chip IGBT module under DC condition ", in proc. IEEE IAS'2006, Oct. 2007, Florida, USA.
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  • 12
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    • The analysis of IGBT power cycling capability for adjustable speed drives
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    • Lixiang Wei, Russ J Kerkman, and Richard A Lukaszewski, "the analysis of IGBT power cycling capability for adjustable speed drives", in proc. IEEE IAS'2008, Oct. 2008, Alberta, CA.
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  • 13
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    • Doubly Fed Machines in Wind Turbine Systems: Is this application limiting the lifetime of IGBT frequency converters?
    • Germany
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.