Super-smooth surface defects measurement and evaluation system

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7656, Issue PART 1, 2010, Pages

  Gao, Xin ^a   Yang, Yongying ^a   Zhao, Peng ^a   Xiao, Bing ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

dark field imaging; feature extraction; image mosaic; Surface defects

Indexed keywords

DARK FIELD IMAGING; DARK-FIELD; EMITTING SOURCES; EVALUATION SYSTEM; FEATURE-BASED; HIGH QUALITY; IMAGE BLOCKS; IMAGE MOSAIC; IMAGE MOSAIC ALGORITHMS; IMAGE PREPROCESSING; IMAGING DEVICE; IMAGING MODEL; MULTI-CYCLE; NEW SYSTEM; ORIGINAL SYSTEMS; OVERLAPPING AREA; PANORAMIC IMAGES; REGION GROWING; RELIABLE RECOGNITION; SCANNING SYSTEMS; SUBAPERTURE; TEMPLATE MATCHING METHOD; TUNGSTEN LAMPS;

ALGORITHMS; FEATURE EXTRACTION; IMAGE MATCHING; IMAGE PROCESSING; INCANDESCENT LAMPS; LIGHT SOURCES; MEASUREMENT THEORY; OPTICAL TESTING; QUALITY CONTROL; TECHNOLOGY; TEMPLATE MATCHING; TUNGSTEN;

SURFACE DEFECTS;

EID: 78650049830     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.867072     Document Type: Conference Paper

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