Laser damage testing of small optics for the national ignition facility

Applied Optics

Volumn 44, Issue 17, 2005, Pages 3527-3531

  Chow, Robert ^a   Runkel, Mike ^a   Taylor, John R ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLEANING; COATINGS; IRRADIATION; LASER OPTICS; LASER PULSES; OPTICAL BEAM SPLITTERS; VAPOR DEPOSITION;

DIAGNOSTIC OPTICS; INJECTION LASER SYSTEM (ILS); LASER DAMAGE TESTING; OPTICAL COMPONENTS;

LASER DAMAGE;

EID: 20844450415     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.003527     Document Type: Article

References (12)

1. Substrates were polished either by Bond Optics or by the coating supplier. Antireflective coatings were supplied by CVI Lasers, Rocky Mountain Instruments, Spectra-Physics, Thin Film Labs, and ZC&R. High reflector coatings were supplied by Newport Corp, REOSC, Rocky Mountain Instruments, Spectrum Thin Films, Spectra-Physics, and TecOptics. Polarizer coatings were supplied by Alpine Research Optics, CVI Lasers, Rocky Mountain Instruments, and Spectra-Physics.
2. R. Chow, M. Runkel, J. R. Taylor, D. Becker, and P. Weber, "Small optics laser damage test procedure," Tech. Rep. MEL01-013 (Lawrence Livermore National Laboratory, Livermore, Calif., 2001).
3. M. R. Kozlowski and R. Chow, "The role of defects in laser damage of multilayer coatings," in Laser-Induced Damage in Optical Materials: 1993, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 2114, 640-649 (1994).
4. International Organization for Standards, Optics and Optical Instruments-Preparation of Drawings for Optical Systems, Part 13: Laser Irradiation Damage Threshold, ISO 10110-13 Standards (International Organization for Standards, Geneva, 1997).
5. L. Sheehan, J. Hendrix, C. Battersby, and S. Oberhelman, "NIF small optics laser-induced damage and photometry measurements program," in Optical Manufacturing and Testing II, H. P. Stahl, ed., Proc. SPIE 3782, 518-524 (1999).
6. R. Chow, M. McBurney, W. K. Eickelberg, W. H. Williams, and M. D. Thomas, "Correlation of test data from some NIF small optical components," in Optical Manufacturing and Testing IV, H. P. Stahl, ed., Proc. SPIE 4451, 384-393 (2001).
7. M. Runkel, "Report for trip to Big Sky Laser Technologies," Tech. Rep. NIF0108072 (Lawrence Livermore National Laboratory, Livermore, Calif., 2003).
8. F. Rainer, L. J. Atherton, J. H. Campbell, F. P. DeMarco, M. R. Kozlowski, A. J. Morgan, and M. C. Staggs, "Four-harmonic database of laser damage testing," in Laser-Induced Damage in Optical Materials: 1991, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 1624, 116-127 (1992).
9. S. R. Foltyn and L. J. Jolin, "Long-range pulse-length scaling of 351 nm laser damage thresholds," in Proceedings on Laser Induced Damage in Optical Materials: 1986, NIST Spec. Publ. 752, 336-343 (1981).
10. M. D. Crisp, N. L. Boling, and G. Dube, "Importance of Fresnel reflections in laser surface damage of transparent dielectrics," Appl. Phys. Lett. 21, 364-366 (1972).
11. M. D. Feit, Lawrence Livermore National Laboratory, P.O. Box 808, Livermore, Calif. 94550 (private communications, 2004).
12. R. J. Tench, R. Chow, and M. R. Kozlowski, "Characterization of defect geometries in multilayer optical coatings," J. Vac. Sci. Technol. A 12, 2808-2813 (1994).