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Volumn 105, Issue 24, 2010, Pages

Measuring energy differences by BEC interferometry on a chip

Author keywords

[No Author keywords available]

Indexed keywords

ATOM CHIPS; BOSE-EINSTEIN CONDENSATES; CHIP SURFACES; ENERGY DIFFERENCES; INTERFEROMETRIC MEASUREMENT; RF MAGNETIC FIELDS; SMALL ENERGY; STATISTICAL NOISE;

EID: 78650020958     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.105.243003     Document Type: Article
Times cited : (65)

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