Random field characterization considering statistical dependence for probability analysis and design

Journal of Mechanical Design

Volumn 132, Issue 10, 2010, Pages

  Xi, Zhimin ^a   Youn, Byeng D ^b   Hu, Chao ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b Seoul National University   (South Korea)

Author keywords

eigenvector dimension reduction; probability analysis and design; proper orthogonal decomposition; random field

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; ELECTROMECHANICAL DEVICES; PRINCIPAL COMPONENT ANALYSIS; PRODUCT DESIGN; STATISTICS;

EIGENVECTOR DIMENSION REDUCTIONS; FIELD VARIABLES; ORTHOGONAL DECOMPOSITION; PROBABILITY ANALYSIS; PROBABILITY DESIGN; PROPER ORTHOGONAL; PROPER ORTHOGONAL DECOMPOSITION; RANDOM FIELD CHARACTERIZATION; RANDOM FIELDS; STATISTICAL DEPENDENCE;

MEMS;

EID: 78650001964     PISSN: 10500472     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.4002293     Document Type: Review

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