Effects of interfacial pressure on tracking failure between XLPE and silicon rubber

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 17, Issue 6, 2010, Pages 1922-1930

  Du, B X ^a   Gu, L ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

carbonization; discharge light; fractal dimension; image processing; interfacial pressure; silicon rubber; tracking failure; XLPE cable joint

Indexed keywords

DISCHARGE LIGHT; INTERFACIAL PRESSURE; SILICON RUBBER; TRACKING FAILURE; XLPE CABLES;

CABLE JOINTING; CABLES; CARBONIZATION; COKE; ELECTRIC LOAD DISTRIBUTION; FRACTAL DIMENSION; IMAGE PROCESSING; IMAGING SYSTEMS; PARTIAL DISCHARGES; TRACKING (POSITION);

RUBBER;

EID: 78649990062     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2010.5658247     Document Type: Article

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