Sapphire analyzers for high-resolution X-ray spectroscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 582, Issue 1, 2007, Pages 149-151

  Yavaş, Hasan ^a,b,c   Ercan Alp, E ^b   Sinn, Harald ^b,d   Alatas, Ahmet ^b   Said, Ayman H ^b,e   Shvyd'ko, Yuri ^b   Toellner, Thomas ^b   Khachatryan, Ruben ^b   Billinge, Simon J L ^a   Zahid Hasan, M ^c   Sturhahn, Wolfgang ^b  

^a MICHIGAN STATE UNIVERSITY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c PRINCETON UNIVERSITY   (United States)

^d DESY   (Germany)

^e WESTERN MICHIGAN UNIVERSITY   (United States)

Author keywords

Resonant inelastic X ray scattering; Sapphire; Synchrotron instrumentation; X ray spectrometer

Indexed keywords

PHONONS; SYNCHROTRONS; X RAY SCATTERING; X RAY SPECTROMETERS; X RAY SPECTROSCOPY;

ENERGY RESOLUTION; RESONANT INELASTIC X RAY SCATTERING; SYNCHROTRON INSTRUMENTATION;

SAPPHIRE;

EID: 35348899431     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.08.095     Document Type: Article

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