All-chalcogenide middle infrared dielectric reflector and filter

Journal of Non-Crystalline Solids

Volumn 357, Issue 1, 2011, Pages 157-160

  Kohoutek, T ^a   Orava, J ^a   Prikryl, J ^a   Wagner, T ^a   Frumar, M ^a  

^a UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

Amorphous semiconductors; ; Chalcogenides; ; Ellipsometry; Multilayers;

Indexed keywords

CHALCOGENIDE FILMS; CHALCOGENIDE MATERIALS; COMPOSITIONAL HOMOGENEITY; DIELECTRIC REFLECTORS; EXPERIMENTAL DATA; FIRST ORDER; HIGH TRANSPARENCY; INFRARED REGIONS; MIDDLE INFRARED; PASS BANDS; PASSBAND FILTERS; QUARTER WAVE STACKS; REFLECTANCE SPECTRUM; SECOND ORDERS; STOPBAND; THEORETICAL PREDICTION; THERMAL AND OPTICAL PROPERTIES;

AMORPHOUS SEMICONDUCTORS; CHALCOGENIDES; ELLIPSOMETRY; ENERGY GAP; FILM PREPARATION; GERMANIUM; MULTILAYERS; OPTICAL PROPERTIES; REFLECTION; SPONTANEOUS EMISSION; SURFACE ROUGHNESS;

PHASE CHANGE MEMORY;

EID: 78649744698     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2010.10.028     Document Type: Article

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