Three-dimensional depth-resolved and extended-resolution micro-particle characterization by holographic light scattering spectroscopy

Optics Express

Volumn 18, Issue 24, 2010, Pages 25116-25126

  Gutzler, Thomas ^a   Hillman, Timothy R ^a,b   Alexandrov, Sergey A ^a   Sampson, David D ^a  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SCATTERING; REFRACTION; THREE DIMENSIONAL;

ANGULAR RANGE; ANGULAR SCATTERING; COMPUTATIONAL DEPTH; DEPTH-RESOLVED; FOURIER; LIGHT SCATTERING SPECTROSCOPY; PARTICLE CHARACTERIZATION; SIZE DETECTION; SPATIALLY RESOLVED; WIDE FIELD OF VIEW;

SCATTERING;

MICROSPHERE;

ARTICLE; HOLOGRAPHY; IMAGE ENHANCEMENT; LIGHT; METHODOLOGY; PARTICLE SIZE; RADIATION SCATTERING; SPECTROSCOPY; THREE DIMENSIONAL IMAGING;

HOLOGRAPHY; IMAGE ENHANCEMENT; IMAGING, THREE-DIMENSIONAL; LIGHT; MICROSPHERES; PARTICLE SIZE; SCATTERING, RADIATION; SPECTRUM ANALYSIS;

EID: 78649708502     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.025116     Document Type: Article

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