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Volumn 35, Issue 10, 2010, Pages 1641-1643

Fiber-optic interferometric two-dimensional scattering-measurement system

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR MEASUREMENTS; ANGULAR SCATTERING; DIFFERENT SIZES; DOUBLE LAYERS; EXPERIMENTAL DATA; FOURIER-DOMAIN; FULL CONTROL; INTERFEROMETRIC SYSTEM; KEY FEATURE; LOW COHERENCE INTERFEROMETRY; MEASUREMENT SYSTEM; MEASURING DEPTH; MICHELSON; MIE THEORY; POLARIZATION-SENSITIVE DETECTION; SAGNAC INTERFEROMETER; STRUCTURAL MEASUREMENTS; SUB-WAVELENGTH; TWO-DIMENSION; TWO-DIMENSIONAL SCATTERING;

EID: 77954917003     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.35.001641     Document Type: Article
Times cited : (15)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.