Evaluation of carbon incorporation and strain of doped MgB2 superconductor by Raman spectroscopy

Scripta Materialia

Volumn 64, Issue 4, 2011, Pages 323-326

  Yeoh, W K ^a   Zheng, R K ^a   Ringer, S P ^a   Li, W X ^b   Xu, X ^b   Dou, S X ^b   Chen, S K ^c   MacManus Driscoll, J L ^d  

^a UNIVERSITY OF SYDNEY   (Australia)

^b UNIVERSITY OF WOLLONGONG   (Australia)

^c UNIVERSITY PUTRA MALAYSIA   (Malaysia)

^d UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Carbon doping; Raman spectroscopy; Superconductors; X ray diffraction

Indexed keywords

BULK SAMPLES; C CONTENTS; CARBON DOPING; CARBON INCORPORATION; CARBON SUBSTITUTION; HIGHLY STRAINED; LATTICE PARAMETERS; LATTICE STRAIN; LATTICE VARIATION; SUPERCONDUCTORS;

DIFFRACTION; DOPING (ADDITIVES); RAMAN SPECTROSCOPY; SILICON CARBIDE; SUPERCONDUCTING MATERIALS; SUPERCONDUCTIVITY; X RAY DIFFRACTION; X RAYS;

RAMAN SCATTERING;

EID: 78649631809     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2010.10.025     Document Type: Article

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